-40%
JEOL Wafer Stage Assembly 200mm JWS-7555S Wafer Defect Review SEM Working Spare
$ 1326.43
- Description
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Description
JEOL Wafer Stage Assembly 200mm JWS-7555S Wafer Defect Review SEM Working SpareInventory # CONF-1168
Part No: Wafer Stage Assembly
Removed from a JEOL JWS-7555S Wafer Defect Review SEM Scanning Electron Microscope System
This JEOL Wafer Stage Assembly 200mm JWS-7555S Wafer Defect Review SEM is used working surplus. The physical condition is good, but there are signs of previous use and handling.
Sale Details
Item Condition:
Used Working, 90 Day Warranty
Estimated Packed Shipping Dimensions:
L x W x H = 20"x20"x20" @ 43 lbs.
Only items pictured are included:
If a part is not pictured, or mentioned above, then it is not included in the sale. Pictured test equipment is not included or available for sale.
For items with multiple quantities:
The pictured item is not necessarily the one that will be sent. Serial numbers or country of manufacture may vary.
Items are sold with a
90-Day Satisfaction Guarantee
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